Calibrators | Probes | Test and Measurement Accessorie | High Voltage Devices
MICRO-KLEPS

MICRO-KLEPS Clamp Test Probe

Miniature clamp-type test probe with rotating grip jaws
(SMD technology). The insulated shaft can be bent up to 35°.
Suitable for very thin wires and densely packed contact points
(1.27 mm IC spacing pitch). Connects with MKL... and MAL...




Order-
No.
Type of
Contact
Clamping
Range
Type of
Termination
Rated
Voltage
Rated
Current
Contact
Resistance
Material
Temperature
Range
Inflammability
Class
Contact Contact
Surface
Housing
973972100
(black)
rotating
grip jaws
2 mm
2 x pin 0.64 mm
DC 60 V
2 A
10 mΩ
spring steel
nickel-plated
PBT
-25 °C to +100 °C
94 HB
973972101
(red)
rotating
grip jaws
2 mm
2 x pin 0.64 mm
DC 60 V
2 A
10 mΩ
spring steel
nickel-plated
PBT
-25 °C to +100 °C
94 HB

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